Compact AFM "NaioAFM" *Demo now available
Measure surface shapes quickly and concisely! Standard features include dust and wind shields, and vibration prevention mechanisms.
The "NaioAFM" is a compact type of atomic force microscope that balances functionality and operability, featuring essential technologies for surface shape measurement as standard, while allowing for easy setup of the device and cantilever replacement. Before scanning, necessary retuning, sample approach, and sample plane tilt correction are automatically performed by the software, so once the cantilever is brought close to the sample, the scan begins. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera and side-view observation for positioning ■ Additional measurement modes can be added according to needs ■ Demonstrations can also be conducted at customer locations *For more details, please refer to the materials. Feel free to contact us with any inquiries. If you wish to request a demonstration, please apply through the contact form.
- Company：日本カンタム・デザイン
- Price：Other
